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↑YEAR TITLE AUTHOR(S) INFO TAG
2016 Yellowing of PV Backsheets in Accelerated Tests Can Be Used as a Realistic Indication of Possible Field Failures – Fact or Fiction? E. Parnham, A. Seaman, A. Whitehead, W. Brennan, E. Ashford Information
2016 Yield Losses of PID-Affected PV Systems - Simulation of Yield Losses Beyond Power Loss J. Arp, B. Jaeckel, J. Behrschmidt Information
2012 Yield Comparison of 7 Currently Available Thin Film Modules S. Janke, M. Strasser Information
2010 Yield Optimization in Photovoltaic Manufacturing S. Kincal, V. Svidenko, P. Smith, R. Raman, M. Abraham, C. Eberspacher Information
2009 Yield and Spectral Effects of a-Si Modules P. Grunow, A. Preiss, S. Koch, S. Krauter Information
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