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Recovery Methods for Modules Affected by Potential Induced Degradation (PID)
PID of standard PV cells has been in the discussion in the last few years. The symptoms of PID have been investigated and some ideas for the mechanism behind were published. This paper focuses on the recovery of PID affected modules both in the field and in the lab. Recovery data of two small systems that were setup in Berlin with PID field returns is presented. Two methods, proper grounding on one hand and applying a regeneration potential in the night on the other hand, are compared. In the laboratory four methods are investigated: storage at room temperature, applying a defined (reversed) potential, treatment with temperature and bias voltage. PID is shortly introduced in case of bifacial cells. This type of cells may be affected by both negative and positive potential since typically both sides are dielectrically passivated.
S. Pingel, S. Janke, O. Frank
Degradation, Reliability, Crystalline Solar Cell, PID
Components for PV Systems
Subtopic: PV Modules
Event: 27th European Photovoltaic Solar Energy Conference and Exhibition
Session: 4BV.2.46
3379 - 3383
ISBN: 3-936338-28-0
Paper DOI: 10.4229/27thEUPVSEC2012-4BV.2.46
0,00 EUR
Document(s): paper