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Potential-Induced Degradation - Comparison of Different Test Methods and Low Irradiance Performance Measurements
G. Mathiak, M. Schweiger, W. Herrmann
Lifetime, Reliability, Safety
Components for PV Systems
Subtopic: PV Modules
Event: 27th European Photovoltaic Solar Energy Conference and Exhibition
Session: 4DO.6.3
3157 - 3162
ISBN: 3-936338-28-0
Paper DOI: 10.4229/27thEUPVSEC2012-4DO.6.3
0,00 EUR
Document(s): paper


Potential-induced degradation (PID) can cause high yield loss in PV systems. Both the industry and customers have therefore requested standardized test methods for evaluating the sensitivity of PV modules to PID effects. Based on the results of a round-robin test with 3 module manufacturers and 4 test institutes, we developed a procedure for detecting PIDsensitive modules with aluminium foil fully covering the glass and frame at 25°C. Working group IEC TC82 WG2 for the standard IEC 62804 draft discusses an alternative test method involving a climatic chamber test at 60°C and 85% relative humidity. The aim of this work is to compare the different test methods and to arrive at a standard test procedure for numerous module types. Electroluminescence imaging at different module currents and low irradiance measurements provide early detection and characterization of the PID effects on degraded modules from the field and in the laboratory.