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Title:
 
Influence of Humidity and Temperature on the Potential Induced Degradation
 
Abstract/Summary:
 
This paper focuses on the physical conditions for a degradation mechanism of photovoltaic modules, known as potential induced degradation (PID). The analysis was made on several levels. At first, the influence of humidity and temperature on the potential induced leakage current has been investigated, the second step consists of an accelerated test scheme in a climatic chamber, the third one is outdoor exposure with high voltage stress in two different climate regions. The humidity has a huge impact on the leakage current. Therefor a test in the climate chamber accelerates the stress found in the field some orders of magnitude.
 
 
Author(s):
 
S. Hoffmann, M. Köhl
 
Keywords:
 
Accelerated Testing, PID, High Voltage Stress, Silicon PV-Modules
 
Topic:
 
Components for PV Systems
Subtopic: PV Modules
Event: 27th European Photovoltaic Solar Energy Conference and Exhibition
Session: 4DO.6.1
 
Pages:
 
3148 - 3151
ISBN: 3-936338-28-0
Paper DOI: 10.4229/27thEUPVSEC2012-4DO.6.1
 
Price:
 
 
0,00 EUR
 
Document(s): paper