Search documents

Browse topics

Document details

Near-Field Study of Spatially Resolved Light Scattering in Thin-Film Silicon Solar Cells
K. Bittkau, T. Beckers, R. Carius
Light Trapping, a-Si:H, Near-Field, Fourier Transform
Thin Film Solar Cells
Subtopic: Amorphous and Microcrystalline Silicon Solar Cells
Event: 25th European Photovoltaic Solar Energy Conference and Exhibition / 5th World Conference on Photovoltaic Energy Conversion, 6-10 September 2010, Valencia, Spain
Session: 3AV.1.40
2996 - 2999
ISBN: 3-936338-26-4
Paper DOI: 10.4229/25thEUPVSEC2010-3AV.1.40
0,00 EUR
Document(s): paper


A method to extract spatially and angularly resolved light scattering in thin-film solar cells from near-field scanning optical microscopy (NSOM) images is developed which applies Fourier band-pass filters to the experimentally obtained near-field images. The analysis allows the identification of individual surface structures of randomly textured interfaces which provide high light trapping potential. It will be shown that the local light scattering properties and, thus, the light trapping strongly differ on a microscopic scale. The visualization of local light trapping efficiency by NSOM is demonstrated in a thin-film silicon solar cell.