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Document details

 
Title:
 
Light Trapping Simulated by Fast and Accurate Transfer Matrix Approach
 
Author(s):
 
J. Holovsky, R. Nevyhosteny
 
Keywords:
 
Light Trapping, Optical Simulation, Scattering, Solar Cells, Transfer Matrix
 
Topic:
 
New Materials and Concepts for Photovoltaic Devices
Subtopic: Fundamental Studies
Event: 33rd European Photovoltaic Solar Energy Conference and Exhibition
Session: 1CV.3.26
 
Pages:
 
99 - 101
ISBN: 3-936338-47-7
Paper DOI: 10.4229/EUPVSEC20172017-1CV.3.26
 
Price:
 
 
0,00 EUR
 
Document(s): paper
 

Abstract/Summary:


Today’s photovoltaic technologies are optimized to conditions that hardly happen at the same time: 1000W/m2 normal irradiance and 25°C cell temperature. Partially, this makes sense for a concept of solar parks generating and selling electricity at a fixed price. This is however an outdated concept when the generation in the middle of a sunny day had a priority. The future concepts will on the other hand take into account also the electricity demand, thus making the optimization process much more complicated. Mathematical tools that can quickly calculate energy generation at a point in time with given irradiance, angle and temperature will be highly desirable in device optimization. Obviously, technology of crystalline silicon will stay involved. There, we cannot forget the chase for higher efficiency which pushes down the crystalline silicon wafer thicknesses while maintaining the optical absorption. Concept of light scattering on a nano-rough surfaces might then be applied together with usual geometrical approaches. Another popular concept will be a tandem of crystalline silicon and hybrid perovskite which is usually a layer with notable light scattering at nano-porous TiO layer. In all these cases the proper light management will be a crucial optimization field. It will inevitably combine geometrical ray-tracing in thick wafer together with thin-film Fresnel optics in contacts or top thin-film sub-cell, but also light scattering. The concept of light scattering and light trapping used to be inevitable for maintaining the technology of amorphous silicon profitable for long time. This strong light trapping concept will again rise in importance for current technologies, but fast methods of simulations will have priority in more comprehensive optimization over the time-consuming methods such as finite element or FDTD method. In this paper we present a novel approach of optical simulation of multilayer with accounting surface scattering that is based on complex transfer matrix concept, similarly as the non-scattered Fresnel component. This allows treatment of light trapping and effects of evanescent waves also for the scattered light. The only condition is to include phase randomization present in the case of light scattering.