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Title:
 
Accelerated LeTID Testing with Dark Current Voltage Characteristics Co-Measurement
 
Author(s):
 
B. Kubicek, K.A. Berger, G. Újvári
 
Topic:
 
Photovoltaic Modules and BoS Components
Subtopic: PV Module Design, Manufacture, Performance and Reliability
Event: 37th European Photovoltaic Solar Energy Conference and Exhibition
Session: 4AV.1.45
ISBN: 3-936338-73-6
 
Price:
 
 
0,00 EUR
 
Document(s): poster
 

Abstract/Summary:


To identifying light and elevated temperature induced degradation, different procedures to perform accelerated testing were discussed. Typically, modules are aged in heated climatic chambers, and after a defined interval, characterized using a flash based bright currentvoltage (IV) characteristic. E.g. the change in MPP-Power can be used as a criteria, if the test can be aborted or more cycles are needed. In this poster, dark-IV-characteristics are evaluated as a alternative in-situ measurement tool.