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Title:
 
Characterizing the Impact of Potential-Induced Degradation and Recovery on the Irradiance and Temperature Dependence of Photovoltaic Modules
 
Author(s):
 
R. Desharnais
 
Keywords:
 
Energy Yield, Temperature Coefficient, Potential Induced Degradation, Recovery, Multi-irradiance
 
Topic:
 
OPERATIONS, PERFORMANCE AND RELIABILITY OF PHOTOVOLTAICS (from Cells to Systems)
Subtopic: Performance and Reliability of Solar Cells
Event: 29th European Photovoltaic Solar Energy Conference and Exhibition
Session: 5CO.14.4
 
Pages:
 
2346 - 2350
ISBN: 3-936338-34-5
Paper DOI: 10.4229/EUPVSEC20142014-5CO.14.4
 
Price:
 
 
0,00 EUR
 
Document(s): paper
 

Abstract/Summary:


Potential-induced degradation (PID) has been a growing area of concern and topic of research within the photovoltaic (PV) industry in recent years, prompting numerous publications on the subject and a draft testing standard currently under review (IEC 62804-1). A significant amount of this work has focused on the electrical performance of PV modules at standard test conditions (STC) after PID testing and, in some cases, following attempted PID recovery. According to IEC 62804-1, electroluminescence (EL) imaging and current-voltage measurements at low current and irradiance conditions are considered to be optional and to be used only as an early detection method of PID. Taking a different perspective, the work presented below incorporates EL, multi-irradiance, and temperature coefficient testing into the characterization of PV module performance before and after accelerated PID testing following IEC 62804 with negative bias applied, and again after recovery testing in which positive bias is applied repeatedly. To capture the results in a single metric that is more meaningful to the greater PV industry, energy simulations are performed to quantify the impact of PID and recovery on simulated energy yield, using the software PVsyst.