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Title:
 
Demonstration of a Novel Inspection System for a Solar Cell Using Terahertz Emission Imaging
 
Author(s):
 
H. Nakanishi, A. Ito, M. Mizubata, I. Kawayama, H. Murakami, M. Tonouchi
 
Keywords:
 
Solar Cell, Terahertz, Femtosecond Laser, Inspection
 
Topic:
 
WAFER-BASED SILICON SOLAR CELLS AND MATERIALS TECHNOLOGY
Subtopic: Silicon Solar Cell Characterisation and Modelling
Event: 31st European Photovoltaic Solar Energy Conference and Exhibition
Session: 2DO.4.5
 
Pages:
 
511 - 513
ISBN: 3-936338-39-6
Paper DOI: 10.4229/EUPVSEC20152015-2DO.4.5
 
Price:
 
 
0,00 EUR
 
Document(s): paper
 

Abstract/Summary:


A laser terahertz emission microscope (LTEM) is a non-contact inspection technique based on a THz emission spectroscopy and imaging that can visualize intensity of pulsed terahertz radiation from the materials and devices excited by femtosecond laser pulses. We have applied LTEM to characterize local properties of a solar cell and have demonstrated the potential of LTEM as imaging technique of photoexcited current in a solar cell. In this study, we experimentally compared LTEM with conventional analysis methods, e. g. electroluminescence (EL), and laser beam induced current (LBIC) images, in order to examine its feasibility as a solar cell inspection technique. It was found that LTEM image was clearly different from EL and LBIC images and LTEM was more sensitive to the surface morphology and crystallographic grains of solar cells than EL and LBIC. We could clearly distinguish grain boundaries, steps and cracks in a polycrystalline silicon solar cell, which could not be seen with EL and LBIC. Finally, we have succeeded in the development of the prototype of solar cell inspection system based on LTEM for commercial application. The prototype system will be installed in the Fukushima Renewable Energy Institute, AIST (FREA) in Japan.