Title: |
Detecting Multivalent Defect Levels Using Deep Level Transient Spectroscopy |
Author(s): |
Z. Zhou, M.K. Juhl, F.E. Rougieux |
Topic: |
Silicon Materials and Cells |
Subtopic: | Characterisation & Simulation of Si Cells |
Event: | 37th European Photovoltaic Solar Energy Conference and Exhibition |
Session: | 2CO.14.5 |
ISBN: | 3-936338-73-6 |
Price: |
0,00 EUR |
Document(s): |
presentation |