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Title:
 
Experimental Study on Detection Technology of PV Modules with Shorten Bypass Diode
 
Author(s):
 
S. Nishikawa, C. Nagao, R. Kase
 
Keywords:
 
Bypass Diodes, Short Circuit, Infrared, PV Module, DC Power Source
 
Topic:
 
OPERATIONS, PERFORMANCE AND RELIABILITY OF PHOTOVOLTAICS (FROM CELLS TO SYSTEMS)
Subtopic: PV Modules
Event: 31st European Photovoltaic Solar Energy Conference and Exhibition
Session: 5CV.2.39
 
Pages:
 
2575 - 2578
ISBN: 3-936338-39-6
Paper DOI: 10.4229/EUPVSEC20152015-5CV.2.39
 
Price:
 
 
0,00 EUR
 
Document(s): paper, poster
 

Abstract/Summary:


Since short-circuit of bypass diodes of PV module causes output reduction and hotospot of PV module, we have to detect the failure as soon as possible. However, since existing detection technology is affected by environmental conditions, we propose new detection technology for identifying position of failure using DC power source and infrared camera. In this detection method, since surface temperature of cells connected to noramal bypass diode is different from that of cells connected to short-circuit bypass diode, we can find difference of those temperature with infrared camera. The theoretical merit of this technology is that detection results is not affected by environmental condition such as irradiation, so on. As the first step of study, we conducted indoor and outdoor tests and we found the failure position in a minute with 20% current of Isc under the indoor test. However, it was difficult to find the failure position under outdoor test more than indoor test. Because environment condition affects the surface temperature of PV modules. Therefore, we have to clear proper curent and time to find failure positions at the next study.