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Title:
 
Evidence of Rear Surface Related Degradation in Cz-Si PERC-Type Solar Cells
 
Author(s):
 
A. Herguth, C. Derricks, D. Sperber
 
Keywords:
 
Degradation, Silicon Solar Cell(s), Rear Surface Passivation, PERC, Surface Related Degradation
 
Topic:
 
Silicon Cells
Subtopic: Homojunction Solar Cells
Event: 35th European Photovoltaic Solar Energy Conference and Exhibition
Session: 2BO.4.6
 
Pages:
 
395 - 397
ISBN: 3-936338-50-7
Paper DOI: 10.4229/35thEUPVSEC20182018-2BO.4.6
 
Price:
 
 
0,00 EUR
 
Document(s): paper
 

Abstract/Summary:


A degradation phenomenon of unknown origin during an accelerated aging test comprising illuminated annealing is observed for boron-doped PERC-type solar cells with SiOx/SiNx:H rear surface passivation. By collating different measurement techniques and simulations, the rear surface passivation is identified as component responsible for the observed degradation. The observed degradation on solar cell level shows similarities to the degradation of similar passivation layers in lifetime studies.