Title: |
Early Stage Quality Assessment in Silicon Ingots from MDP Brick Characterization |
Author(s): |
A.S. Kovvali, M. Demant, B. Rebba, N. Schüler, J. Haunschild, S. Rein |
Keywords: |
Ingot Quality, Material Characterization, Cast Mono Silicon, High Performance Multicrystalline Silicon, MDP |
Topic: |
Silicon Materials and Cells |
Subtopic: | Feedstock, Crystallisation, Wafering, Defect Engineering |
Event: | 37th European Photovoltaic Solar Energy Conference and Exhibition |
Session: | 2DV.2.11 |
Pages: |
452 - 458 |
ISBN: | 3-936338-73-6 |
Paper DOI: | 10.4229/EUPVSEC20202020-2DV.2.11 |
Price: |
0,00 EUR |
Document(s): |
paper |