Title: |
Firing-Triggered LID (FT-LID) of the Carrier Lifetime in Cz-Si |
Author(s): |
M. Winter, L. Helmich, D.C. Walter, J. Schmidt |
Keywords: |
Defects, Degradation, Lifetime, Silicon, LID |
Topic: |
Silicon Materials and Cells |
Subtopic: | Feedstock, Crystallisation, Wafering, Defect Engineering |
Event: | 37th European Photovoltaic Solar Energy Conference and Exhibition |
Session: | 2DV.2.15 |
Pages: |
462 - 467 |
ISBN: | 3-936338-73-6 |
Paper DOI: | 10.4229/EUPVSEC20202020-2DV.2.15 |
Price: |
0,00 EUR |
Document(s): |
paper |