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Flasher Tolerances of Power Measurement on Micromorph Tandem Modules
A. Böttcher, A. Prorok, N. Ferretti, A. Preiss, S. Krauter, P. Grunow
Sun Simulator, Spectral Mismatch, Micromorph Silicon Cells
Thin Film Solar Cells
Subtopic: Amorphous and Microcrystalline Silicon Solar Cells
Event: 25th European Photovoltaic Solar Energy Conference and Exhibition / 5th World Conference on Photovoltaic Energy Conversion, 6-10 September 2010, Valencia, Spain
Session: 3AV.2.7
3161 - 3164
ISBN: 3-936338-26-4
Paper DOI: 10.4229/25thEUPVSEC2010-3AV.2.7
0,00 EUR
Document(s): paper


For the measurement of tandem cells under a sun simulator, the spectral mismatch correction of the short circuit current to the AM 1.5 standard spectrum cannot be calculated as for single junction cells. Therefore the power determination of multiple junction cells and modules underlies considerable additional uncertainties. The measurement tolerance depends not only on the spectrum of the sun simulator and the spectral response of the test and the reference cell, but also on the degree of the blocking ability of the tandem cell’s limiting junction. In this work, the influence of the limiting junction on the spectral mismatch of sun simulator measurement of the power of tandem modules is studied as a function of their reverse currents. In consequence, the error bar is also a function of the individual tandem cell module under test, even if the spectral responses were assumed as fixed. In this paper a μ-morph tandem cell is modelled with two filtered crystalline cells. An upper limit for the additional error bar from the tandem problem is estimated on the basis of the given spectral quality of the sun simulator spectrum and the reverse current characteristics of the module.