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Title:
 
Holistic View of Interactions in Modules Affecting Durability – Adhesion and Snail Trails
 
Author(s):
 
A. Meisel, Y. Xu, J. Fan, J. Wang, T. Dang, C. Alcantara, D. Inns, M. Terry, J. Kapur, B. Hamzavy, W. Gambogi, H. Antoniadis
 
Keywords:
 
Reliability, Module, Adhesion, Encapsulant/s, EVA, Snail Trails
 
Topic:
 
OPERATIONS, PERFORMANCE AND RELIABILITY OF PHOTOVOLTAICS (FROM CELLS TO SYSTEMS)
Subtopic: PV Modules
Event: 31st European Photovoltaic Solar Energy Conference and Exhibition
Session: 5DO.10.5
 
Pages:
 
1862 - 1865
ISBN: 3-936338-39-6
Paper DOI: 10.4229/EUPVSEC20152015-5DO.10.5
 
Price:
 
 
0,00 EUR
 
Document(s): paper
 

Abstract/Summary:


DuPont has a deep interest in long-term module reliability in relation to our products for the solar market. We have several thrusts to study the interactions of photovoltaic module component materials and their impact on module durability from a holistic point of view. While the impact of backsheets and encapsulants on module durability has been studied to a great extent by DuPont and others, the role of metallization pastes is significantly less understood. One durability-related aspect of metallization pastes is their adhesion strength to the tabbing ribbons. We have developed methods to control adhesion over a wide range and are among the first to quantify the impact of adhesion on module durability. A second thrust is the interactions between module components in the formation of snail trails on the surface of PV modules. Our investigation into the influence of micro-cracks as well as the material properties of encapsulants and backsheets on the rates of water ingression and subsequent snail trail formation is presented. We also discuss the development and effectiveness of accelerated test methodologies replacing the current time-consuming field aging test method to establish snail trail susceptibility and rate of formation, thereby applying them to specific module designs. Data from module field exposure tests is presented to correlate with lab accelerated aging tests.