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Title:
 
Hot-Spot Measurements on Crystalline Silicon Solar Cells with Different Reverse Current Characteristic
 
Author(s):
 
L. Podlowski, S. Janke, B. Litzenburger, S. Pingel, S. Wendlandt, J. Teubner, J. Berghold
 
Keywords:
 
Degradation, Reliability, Module, Hot Spot
 
Topic:
 
OPERATIONS, PERFORMANCE AND RELIABILITY OF PHOTOVOLTAICS (FROM CELLS TO SYSTEMS)
Subtopic: PV Modules
Event: 31st European Photovoltaic Solar Energy Conference and Exhibition
Session: 5CV.2.32
 
Pages:
 
2554 - 2556
ISBN: 3-936338-39-6
Paper DOI: 10.4229/EUPVSEC20152015-5CV.2.32
 
Price:
 
 
0,00 EUR
 
Document(s): paper, poster
 

Abstract/Summary:


Hot spots of crystalline silicon solar cells are a major failure mode for solar modules. Consecutive on our last year’s investigation where we showed that a comparison of (i) a simple hot spot test on bare cells in the dark to (ii) a hot spot test on module level with complete shaded cells gives a rather wide spread in temperature rise with non-perfect correlation. In this work we shortly recapitulate and present investigation where we varied the shading level of laminated solar cells with different reverse bias current levels. The data shows for each solar cell a worst case shading scenario that is dominated by the reverse bias current behavior. This finding is also supported by simulations that show a comparable maximal dissipated power for each investigated cell.