Title:	Investigating the Effect of Interstitial Fe Impurity Contamination on n-Type Cz-Silicon Material for High Efficiency Solar Cell Processing
Author(s):	A. Hajjiah, H. Badran, I. Gordon, J. Szlufcik, J. Poortmans, J. John
Keywords:	Lifetime, Crystalline Silicon, Silicon Solar Cell(s), n-Type
Topic:	Silicon Materials and Cells
Subtopic:	High Temperature Route for Si Cells
Event:	37th European Photovoltaic Solar Energy Conference and Exhibition
Session:	2DV.3.18
Pages:	512 - 515
ISBN:	3-936338-73-6
Paper DOI:	10.4229/EUPVSEC20202020-2DV.3.18
Price:	0,00 EUR
Document(s):	paper

Abstract/Summary:

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In this work the impact of iron contamination on n-type cz-silicon material is investigated mimicking a silicon solar cell manufacturing process flow. The Fe impurities are deposited on the wafer surface and driven in by a high temperature step providing a bulk concentration range varying from 3.5e12/cm3 to 2.7e14/cm3. Effective minority carrier lifetimes are measured and fitted to the curve derived from SRH theory. Capture cross section for interstitial Fe could be extracted to be 6.45e-17 cm/s +/- 2.23e-17 cm/s which is in good consensus with literature values. The achieved values are used in QUOKKA to perform silicon solar cell simulations. For very low bulk Fe concentrations of 2.5e12/cm3 (surface concentration of 6e10/cm2) a degradation of the solar cell efficiency of 10% relative is calculated.