Title: |
Insights on Cell Edge Defects Impact and Post-Process Repassivation for Heterojunction |
Author(s): |
B. Portaluppi, S. Harrison, V. Giglia, A. Sekkat, D. Munoz-Rojas |
Keywords: |
Heterojunction, AlOx, Shingle, Cut Losses, Edge Repassivation |
Topic: |
Silicon Materials and Cells |
Subtopic: | Low Temperature Route for Si Cells |
Event: | 37th European Photovoltaic Solar Energy Conference and Exhibition |
Session: | 2DV.3.16 |
Pages: |
504 - 507 |
ISBN: | 3-936338-73-6 |
Paper DOI: | 10.4229/EUPVSEC20202020-2DV.3.16 |
Price: |
0,00 EUR |
Document(s): |
paper |