Title:	Investigation of the Potential Induced Degradation for PERC Solar Cells
Author(s):	M.-A. Tsai, Y.-S. Long, T.-C. Wu
Keywords:	PID, LID, Accelerated Degradation Test
Topic:	Silicon Materials and Cells
Subtopic:	Characterisation & Simulation of Si Cells
Event:	38th European Photovoltaic Solar Energy Conference and Exhibition
Session:	2CV.1.23
Pages:	274 - 275
ISBN:	3-936338-78-7
Paper DOI:	10.4229/EUPVSEC20212021-2CV.1.23
Price:	0,00 EUR
Document(s):	paper, poster

Abstract/Summary:

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In the past few years, potential induced degradation (PID) has received considerable attention due to its catastrophic impact on the reliability of PV modules. The transportation of sodium ions triggered by a system voltage across PV modules was suspect to be the root causes and was further supported by findings of sodium ions on PIDaffected regions in silicon solar cells. Here we use consistent lower volume resistivity packaging materials to test high-efficiency cells fabricated by different manufacturers. Under 192 hour test, Some samples have slightly obvious defects.