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Monofacial IV Measurements of Bifacial Silicon Solar Cells in an Inter-Laboratory Comparison
M. Rauer, K. Bothe, C. Comparotto, P. Danzl, M. Debucquoy, N. Enjalbert, J. Hohl-Ebinger, P. Manshanden, Y. Veschetti, J.K.C. Wong
Bifacial Solar Cells, IV Measurements, Round Robin, Standardization
Wafer-Based Silicon Solar Cells and Materials Technology
Subtopic: Silicon Solar Cell Characterisation and Modelling
Event: 32nd European Photovoltaic Solar Energy Conference and Exhibition
Session: 2BV.7.25
915 - 921
ISBN: 3-936338-41-8
Paper DOI: 10.4229/EUPVSEC20162016-2BV.7.25
0,00 EUR
Document(s): paper


Standardizing illuminated IV measurements of bifacial solar cells and modules is a central objective for the introduction of bifacial products into the market. In this paper, the application of monofacial IV measurement conditions to bifacial solar cells is evaluated in an inter-laboratory comparison among seven research institutes in Europe. Bifacial silicon solar cells manufactured at five different sites with five different fabrication technologies were used in this investigation. We demonstrate that several characteristics of the measurement setups which are of minor importance for the measurement of monofacial solar cells can significantly affect bifacial solar cell measurements: (i) the reflectance of the measurement chuck and (ii) the electrical conductance of the chuck implying specific contacting schemes. When dividing the measurement results of this round robin into two groups according to chuck reflectance and conductance, the deviations in the IV parameters among the different partners are mostly within the uncertainty limits commonly reported for monofacial solar cell measurements. For standardization of bifacial solar cell measurements, it is therefore important to define admissible ranges for the chuck reflectance and to specify the contacting scheme in the standard.