Title: |
Methodology to Determine Bulk Crystal Quality in Terms of Carrier Lifetime without Wafering |
Author(s): |
M. Müller, A. Weber, A.I. Kropp, M. Ehrl, T. Urban, P. Häussermann, B. Neubert, A. Albrecht, S. Seidel, R. Otto, K. Dadzis, R. Menzel, M. Trempa, C. Kranert, C. Reimann, J. Heitmann |
Keywords: |
c-Si, Defects, Lifetime, Passivation |
Topic: |
Silicon Materials and Cells |
Subtopic: | Feedstock, Crystallisation, Wafering, Defect Engineering |
Event: | 37th European Photovoltaic Solar Energy Conference and Exhibition |
Session: | 2DV.2.10 |
Pages: |
449 - 451 |
ISBN: | 3-936338-73-6 |
Paper DOI: | 10.4229/EUPVSEC20202020-2DV.2.10 |
Price: |
0,00 EUR |
Document(s): |
paper, poster |