Title: |
Next Generation Tools for Accurate Energy Yield Estimation of Bifacial PV Systems – Best Practices, Improvements and Challenges |
Author(s): |
I.T. Horvath, H. Goverde, P. Manganiello, A. Schils, A.S.H. Van der Heide, J. Govaerts, E. Voroshazi, G.H. Yordanov, J. Moschner, I. Oroutzoglou, L.A. Radkar, N.-P. Harder, T. Mueller, A. Lambert, S. Scheerlinck, B. Aldalali, D. Soudris, A.H.M.E. Reinders, F. Catthoor, J. Poortmans |
Keywords: |
Bifacial, Ray Tracing, Simulation, Energy Yield, Validation |
Topic: |
PV Systems and Storage – Modelling, Design, Operation and Performance |
Subtopic: | Design and Installation of PV Systems |
Event: | 36th European Photovoltaic Solar Energy Conference and Exhibition |
Session: | 5DP.2.2 |
Pages: |
1261 - 1265 |
ISBN: | 3-936338-60-4 |
Paper DOI: | 10.4229/EUPVSEC20192019-5DP.2.2 |
Price: |
0,00 EUR |
Document(s): |
paper, presentation |