Title:	Novel Accelerated Testing Methods for Faster Evaluation of PV Modules and Materials
Author(s):	A. Borne, K.R. Choudhury, W.J. Gambogi, K.-A. Weiß
Keywords:	Reliability, Module, Backsheet, Durability, Accelerated Testing
Topic:	Photovoltaic Modules and BoS Components
Subtopic:	PV Module Design, Manufacture, Performance and Reliability
Event:	37th European Photovoltaic Solar Energy Conference and Exhibition
Session:	4CO.3.3
Pages:	900 - 903
ISBN:	3-936338-73-6
Paper DOI:	10.4229/EUPVSEC20202020-4CO.3.3
Price:	0,00 EUR
Document(s):	paper

Abstract/Summary:

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Photovoltaic systems must withstand outdoor conditions for at least 25 years, but recent field inspections are revealing that photovoltaic module degradation is jeopardizing performance and safety of installations due to backsheet failure, leading to panel repair and replacement. These failures were not predicted by established module and material test methods. To avoid these issues, improved PV testing methods need to be developed. Current IEC testing standards are not designed to predict the long-term performance of the various materials and tend to involve single stress exposures that address early lifetime design failures. In this paper we describe considerations based on field observations and accelerated testing to develop a novel accelerated testing protocol. The goals are to reproduce the outdoor weathering conditions for testing PV modules with calculation enhanced stressor settings under complex chamber boundary conditions. Photovoltaic modules are tested, and results confirm good match with both outdoor field observations and standard MAST (Module Accelerated Sequential Testing) conditions. The simultaneous exposure to UV, moisture and elevated temperature is assessed as a method of further reducing the testing time required to evaluate new materials and designs.