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Performance Testing of High-Efficient Highly-Capacitive c-Si PV Modules Using Slow-Speed Dark Current-Voltage Characteristics and a Reconstruction Procedure
A. Virtuani, G. Rigamonti
Calibration, Capacitance, Module, Dark, Transient Effects
Subtopic: PV Modules
Event: 28th European Photovoltaic Solar Energy Conference and Exhibition
Session: 4CO.11.4
2876 - 2881
ISBN: 3-936338-33-7
Paper DOI: 10.4229/28thEUPVSEC2013-4CO.11.4
0,00 EUR
Document(s): paper, presentation


Testing high-efficient highly-capacitive c-Si modules with pulsed solar simulators may lead to strong measurement artifacts. The method investigated in this work of testing dark IV curves and reconstructing a steady-state illuminated IV curve by using a translation/reconstruction procedure is the adaptation of a former work for solar cells and has now been validated on a solar module level. The method provides excellent results – with errors in the estimation of Pmax <0.5% - for a set of technologies (Sanyo) and less satisfactory results for another set of devices (Sunpower) leading to a systematic overestimation of the power by+2.5-3%. By extrapolating and comparing the diode PV parameters from the two set of devices, the devices for which the method works better, apparently show a lower discrepancy between dark and light fitted parameters, particularly for the reverse saturation current J0 and the ideality factor n. As the method is very sensitive to a correct determination of the series resistance Rs, particular carefulness should be given in determining this parameter from the measured dark IV curve.hich lead to this discrepancies for some technologies are carefully reviewed and are ascribed to the different electrical behavior of the PV device between dark and illuminated conditions.