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Papers 26 - 30 of 82 matching "Q*"
Show tagged papers| ↑YEAR | TITLE | AUTHOR(S) | INFO | TAG |
|---|---|---|---|---|
| 2014 | Quantifying Internal Optical Losses for 21% n-Si Rear Junction Cells | F. Duerinckx, M. Aleman, P. Choulat, I. Kuzma-Filipek, E. Cornagliotti, J. Szlufcik |  |
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| 2014 | Qualification Testing of PV Module Backsheet Using Self-Adhesive Aluminium Based Foil Compound | M. Rees | |
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| 2014 | Quantification of LID in Multicrystalline Silicon Wafers | R. Søndenå, A. Ghaderi | |
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| 2013 | Quantitative Shunt Determination in Organic Solar Modules Using Lock-in-Thermography | U. Hoyer, S. Besold, J. Bachmann, T. Swonke, C.J. Brabec | |
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| 2013 | Quantitative Assessment of TCO Sheet Resistance in Thin-Film Silicon Devices from Electroluminescence Images | G. Courtois, T. Fuyuki, A. Fuyuki, A. Salomon, P. Roca i Cabarrocas | |