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Papers 26 - 30 of 82 matching "Q*"

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↑YEAR TITLE AUTHOR(S) INFO TAG
2014 Quantifying Internal Optical Losses for 21% n-Si Rear Junction Cells F. Duerinckx, M. Aleman, P. Choulat, I. Kuzma-Filipek, E. Cornagliotti, J. Szlufcik Information
2014 Qualification Testing of PV Module Backsheet Using Self-Adhesive Aluminium Based Foil Compound M. Rees Information
2014 Quantification of LID in Multicrystalline Silicon Wafers R. Søndenå, A. Ghaderi Information
2013 Quantitative Shunt Determination in Organic Solar Modules Using Lock-in-Thermography U. Hoyer, S. Besold, J. Bachmann, T. Swonke, C.J. Brabec Information
2013 Quantitative Assessment of TCO Sheet Resistance in Thin-Film Silicon Devices from Electroluminescence Images G. Courtois, T. Fuyuki, A. Fuyuki, A. Salomon, P. Roca i Cabarrocas Information
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