↑YEAR | TITLE | AUTHOR(S) | INFO | TAG |
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2013 | Quantitative Assessment of TCO Sheet Resistance in Thin-Film Silicon Devices from Electroluminescence Images | G. Courtois, T. Fuyuki, A. Fuyuki, A. Salomon, P. Roca i Cabarrocas | ![]() |
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2013 | Qualitative Analysis of Electrical Mismatch Losses in Photovoltaic Devices | A. Firman, V. Toranzos, A.J. Busso, L.H. Vera, J. de la Casa Higueras | ![]() |
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2013 | Quasiperiodical Microrelief- and Metal Nanowires-Induced Efficiency Enhancement of Surface-Barrier Solar Cells | N.L. Dmitruk, A.V. Korovin, O.Y. Borkovskaya, I.B. Mamontova, S.V. Mamykin | ![]() |
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2012 | Quantative Evaluation of Output Power Degradation for Crystalline Silicon PV Modules in Field Exposure Test by Using Equivalent Circuit Model | K. Hayashi, Y. Takahashi, K. Fujiwara, Y. Ishihara, S. Nishikawa, H. Kato | ![]() |
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2012 | Quantification of Crack-Rates in Multicrystalline Si Wafers and Cells and Correlation with Breakage-Rate in an Industrial Cell Production Line | S. Zimmermann, H. Nagel, A. Metz | ![]() |