Title: |
Quantification of the Light-Induced-Degradation Effects in Iron-Rich Silicon Wafers via Carrier Lifetime Measurements |
Author(s): |
F. Tanay, S. Dubois, N. Enjalbert, J. Veirman, I. Périchaud |
Keywords: |
Degradation, Experimental Method, Lifetime, Silicon (Si), Defect Density |
Topic: |
Wafer-based Silicon Solar Cells and Materials Technology |
Subtopic: | Silicon Solar Cell Characterisation and Modelling |
Event: | 26th European Photovoltaic Solar Energy Conference and Exhibition |
Session: | 2CO.13.6 |
Pages: |
1039 - 1044 |
ISBN: | 3-936338-27-2 |
Paper DOI: | 10.4229/26thEUPVSEC2011-2CO.13.6 |
Price: |
0,00 EUR |
Document(s): |
paper |