Title:	Quantification of Crack-Rates in Multicrystalline Si Wafers and Cells and Correlation with Breakage-Rate in an Industrial Cell Production Line
Author(s):	S. Zimmermann, H. Nagel, A. Metz
Keywords:	Crack Detection, Characterisation, Characterization, Multicrystalline Silicon
Topic:	Wafer-Based Silicon Solar Cells and Materials Technology
Subtopic:	Silicon Solar Cell Characterization and Modelling
Event:	27th European Photovoltaic Solar Energy Conference and Exhibition
Session:	2CO.13.5
Pages:	729 - 731
ISBN:	3-936338-28-0
Paper DOI:	10.4229/27thEUPVSEC2012-2CO.13.5
Price:	0,00 EUR
Document(s):	paper

Abstract/Summary:

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We present a comprehensive experimental study of crack-rates in mc Si wafers and solar cells by use of a novel IR-measurement system. A large number of wafers from several suppliers were investigated after delivery, additional transportation and different processing steps in an industrial cell production line. Our experiments aimed on identification of crack sources, a reduction of crack-rates and therewith the reduction of breakage-rate during cell processing.