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Qualification of an In-Line Spectroscopic Photoluminescence System for CIGS Process Characterization
J.-P. Theisen, T. Marschner, M. Wendt, S. Uredat
Photoluminescence, CBD, CIGS
Subtopic: CdTe, CIS and Related Ternary and Quaternary Thin Film Solar Cells
Event: 28th European Photovoltaic Solar Energy Conference and Exhibition
Session: 3BV.6.40
2422 - 2425
ISBN: 3-936338-33-7
Paper DOI: 10.4229/28thEUPVSEC2013-3BV.6.40
0,00 EUR
Document(s): paper


To improve the manufacturing process of Cu(In,Ga)Se2 thin film modules it is essential to characterize the absorber and to ensure its quality. For this purpose, the LayTec spectroscopic photoluminescence (PL) system has been evaluated in the Manz CIGS Innovation Line to test the advantages of this measurement method under production conditions. The system allows recording the PL signal across the full module length at different module positions and gives spatially resolved information about band gap, material composition and quality of the CIGS absorber material. One advantage of PL compared to X-ray fluorescence (XRF) is the short cycle time of less than 1s per measurement point allowing the in-line use of the system in a full volume production environment. An analysis of the waiting time of CIGS substrates directly after deposition of the CIGS absorber layer shows a decrease of the PL signal strength due to surface oxidation. The subsequently deposited CdS buffer layer, however, stabilizes the surface. Therefore, the PL strength stays constant over days. With the utilization of three measurement heads it is possible to perform line scans at different locations simultaneously. From this e.g. a homogeneity analysis of CIGS campaigns can be done.