Title:	Quantitative Information of Electroluminescence Images
Author(s):	A. Helbig, T. Kirchartz, U. Rau
Keywords:	Silicon (Si), Luminescence, Reciprocity, Quantum Efficiency, Reflectance
Topic:	Advanced Photovoltaics
Subtopic:	Fundamental Studies
Event:	23rd European Photovoltaic Solar Energy Conference and Exhibition, 1-5 September 2008, Valencia, Spain
Session:	1CV.1.59
Pages:	426 - 429
ISBN:	3-936338-24-8
Paper DOI:	10.4229/23rdEUPVSEC2008-1CV.1.59
Price:	0,00 EUR
Document(s):	paper

Abstract/Summary:

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The reciprocity between electroluminescence and solar cell quantum efficiency simplifies the simulation and interpretation of electroluminescence spectra. With this reciprocity link, we show how to gain spatially resolved information about recombinatorial and optical parameters from electroluminescence images by using certain types of filters while recording the images. Simple optical models allow the adaptation of our model to both flat and textured crystalline silicon solar cells. The ratio of two electroluminescence images recorded with two different short pass filters reveals spatially resolved information on the surface recombination velocity and on the bulk diffusion length. The ratio of two images, one recorded with no filter and one with a long pass filter, yields a map of the back side reflectance.