Title:	Quality Estimation of n-Mono Wafers in Silicon Heterojuction Solar Cells Using Photoluminescence Imaging
Author(s):	Z.-Y. Shih, F.-S. Chen, J. Chang, W.-C. Hsieh, M.-Y. Chen
Keywords:	Photoluminescence, Heterojunction Solar Cells, n-Mono Wafer
Topic:	WAFER-BASED SILICON SOLAR CELLS AND MATERIALS TECHNOLOGY
Subtopic:	Manufacturing Issues and Processing
Event:	31st European Photovoltaic Solar Energy Conference and Exhibition
Session:	2BV.8.46
Pages:	884 - 886
ISBN:	3-936338-39-6
Paper DOI:	10.4229/EUPVSEC20152015-2BV.8.46
Price:	0,00 EUR
Document(s):	paper, poster

Abstract/Summary:

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Silicon heterojunction (SHJ) solar cells have potential to achieve high efficiencies. Among many process parameters, wafer quality plays an important role in determining the efficiency of a solar cell. The correlation between wafer quality and cell performance was investigated. The wafers in the top, middle, and bottom parts of each ingot were taken and tested. The results from JV-curve measurements revealed that the decreased efficiencies may be due to ambiguous and dark edges of cells shown in photoluminescence imaging, indicating low quality of wafers. After optimizing cell process with a fine quality of wafer, SHJ solar cell on a 6 inch n-mono wafer with a conversion efficiency of 23.43 % was achieved by AUO HJ-RD team.