Title:	Quantitative Study of Potential Induced Degradation of a Roof-Top PV-Installation with IR-Imaging
Author(s):	C. Buerhop-Lutz, T. Pickel, F.W. Fecher, C. Zetzmann, J. Hauch, C. Camus, C.J. Brabec
Keywords:	Power Loss, IR Imaging, Potential Induced Degradation, PID-Resistance, PID Criteria
Topic:	PV System Performance and Integration
Subtopic:	Design and Operation of PV Systems
Event:	33rd European Photovoltaic Solar Energy Conference and Exhibition
Session:	6BO.8.2
Pages:	1931 - 1936
ISBN:	3-936338-47-7
Paper DOI:	10.4229/EUPVSEC20172017-6BO.8.2
Price:	0,00 EUR
Document(s):	paper

Abstract/Summary:

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Potential induced degradation (PID) causes severe damage and financial losses even in modern PVinstallations. In Germany, approximately 19% of PV-installations suffer from PID and resulting power loss. This paper focuses on the impact of PID in real installations. The analysis focuses exemplarily on a 314 kWp PV-system in the Atlantic coastal climate. Infrared (IR)-imaging is used for identifying PID without operation interruption. Historic electric performance monitoring data for several years are analyzed on system and string level. Additionally, punctually measured module string current-voltage (I-V)-curves are considered. The data sets are combined for understanding the PID behavior of this PV plant. The number of PID affected cells within a string varies strongly between 1 to 22% with the string position on the building complex. A PID-resistance which correlates to the defined PID-defect-ration is presented. Finally, indicators for the reliable determination of PID is given.