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Quantitative Contactless Determination of the Series Resistance of Silicon Solar Cells
H. Höffler, W. Wirtz, J.M. Greulich, S. Rein
c-Si, Photoluminescence, Characterisation, Characterization, Silicon, Contactless IV-Measurement
Silicon Materials and Cells
Subtopic: Characterisation & Simulation of Si Cells
Event: 38th European Photovoltaic Solar Energy Conference and Exhibition
Session: 2CV.1.5
233 - 236
ISBN: 3-936338-78-7
Paper DOI: 10.4229/EUPVSEC20212021-2CV.1.5
0,00 EUR
Document(s): paper, poster


In this contribution we present a method which quantitatively determines the lumped series resistance of silicon solar cells in a contactless manner. The method is one essential step on the way to a completely contactless IV-measurement of silicon solar cells. The method is based on the evaluation of photoluminescence (PL) signals emitted from the cell. PL signals are recorded in a homogeneously illuminated state and in a partially shaded state. A quantitative value of the lumped series resistance is calculated from the corresponding signal ratio. -values determined via the proposed method are compared to -values determined via a conventional reference method. The comparison is carried out for 20 Cz-PERC solar cells featuring a wide range of -values. A correlation coefficient of 0.87 and a root mean square error of 0.17 Ωcm² is obtained. The observed correlation indicates very good agreement.