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Title:
 
The Effects of Annealing Processes on Effective Lifetime in n-Type Crystalline Silicon
 
Author(s):
 
T. Tachibana, K. Nakamura, A. Ogura, Y. Ohshita, T. Shimoda, I. Masada, N. Hayashi, E. Nishijima
 
Keywords:
 
Lifetime, Crystalline Silicon
 
Topic:
 
WAFER-BASED SILICON SOLAR CELLS AND MATERIALS TECHNOLOGY
Subtopic: Silicon Solar Cell Improvements
Event: 31st European Photovoltaic Solar Energy Conference and Exhibition
Session: 2AV.2.21
 
Pages:
 
672 - 674
ISBN: 3-936338-39-6
Paper DOI: 10.4229/EUPVSEC20152015-2AV.2.21
 
Price:
 
 
0,00 EUR
 
Document(s): paper, poster
 

Abstract/Summary:


The relationship between the quality of silicon wafers and annealing effect with several thermal budgets simulating different cell fabrication processes were investigated in this study. Various types of 156 x 156 mm2 n-type CZ wafers were evaluated in this study. The effective minority carrier lifetimes were measured by a photo-conductance lifetime tester with chemical passivation. As the results, the lifetimes increased or decreased depending on the annealing conditions, i.e. temperature and duration. These differences might be due to the growth conditions of wafers, such as thermal budget during the growth. By analyzing the difference in the growth conditions and annealing conditions, we investigate the relationship between the effective lifetime and annealing processes.