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Thermal Cycle Analysis on Shingled Glass – Glass Samples with SHJ Cells
S. Wendlandt, C. Carrière, V. Barth, S. Harrison, A. Bettinelli
Heterojunction, Stability, Shingled
Photovoltaic Modules and BoS Components
Subtopic: PV Module Design, Manufacture, Performance and Reliability
Event: 38th European Photovoltaic Solar Energy Conference and Exhibition
Session: 4AV.2.31
860 - 863
ISBN: 3-936338-78-7
Paper DOI: 10.4229/EUPVSEC20212021-4AV.2.31
0,00 EUR
Document(s): paper, poster


For years photovoltaic (PV) modules were manufactured with 60 or 72 cells in glass / back sheet designs. Since R&D teams around the world simulated the potential to increase the module efficiency by modifying the designs, the industry develops new production machines to realize those. One such novel approach is the shingling – here the wafer is cut into small stripes. In a module, the stripes are overlapping each other at the ends and an ECA interconnects two cells together. To study the thermal long-term stability, we build mini-modules in various designs with shingled SHJ cells and applied an extended thermal stress sequence (3x IEC) to those samples. We analysed the ageing process with image-based and electrical setups.