Title:	Using Low-Cost Scanners for Optical Inspection of Solar Cells
Author(s):	M.K. Juhl, Z. Zhou, B. Puthen-Veettil, D.N.R. Payne
Keywords:	Texturing, Low Cost, Optical Inspection
Topic:	Silicon Materials and Cells
Subtopic:	Characterisation & Simulation of Si Cells
Event:	8th World Conference on Photovoltaic Energy Conversion
Session:	1DV.4.14
Pages:	176 - 179
ISBN:	3-936338-86-8
Paper DOI:	10.4229/WCPEC-82022-1DV.4.14
Price:	0,00 EUR
Document(s):	paper

Abstract/Summary:

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This paper investigates the possibility of using low-cost consumer flatbed scanners for optical inspection of solar cell precursors. Two types of scanners, with contact image sensor (CIS) and charge coupled device (CCD) technologies, are used and compared for monitoring the texturing quality between and across multi-crystalline and mono-crystalline silicon wafers. The performance of the low-cost scanner in monitoring wafer reflectance is evaluated by comparing the outputs with the results from a high-end industry scanning spectrophotometer LOANA. The study shows good qualitative agreement and statistical correlation of multi-crystalline silicon wafer images measured with a low-cost flatbed scanner and the LOANA.