↑YEAR | TITLE | AUTHOR(S) | INFO | TAG |
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2020 | Validating Advanced Stress Testing Protocols Using Analysis of Degraded Polyvinylidene Fluoride-Based Backsheet Films | M. Owen-Bellini, D.C. Miller, D.R. Jenket, P. Hacke, S.M. Moffitt, A. Sinha, L.T. Schelhas, A.M. Maes, J.Y. Hartley, T. Karin, J. Tracy | ![]() |
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2019 | Voltage Control in Grids with High PV-Penetration | Q.T. Tran, T. Le, M.T. Le, F. Bourry, F. Al-Shakarchi | ![]() |
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2019 | Variation of Silicon Wafer Strength and Edge Chipping Induced by Residual Stresses at the Brick Bonding Interface | R. Koepge, K. Buehler, A. Langhans, F. Kaule, E. Velispahic | ![]() |
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2019 | Validated Testing of Grid-Connected PV Inverters for LV Grids by Means of Controller-Hardware-in-the-Loop (CHIL) Setup | G. Lauss, Z. Miletic, C. Messner, F. Leimgruber, C. Seitl | ![]() |
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2018 | Validity Analysis of the Text Book Lumped Series Resistance Approach for Solar Cells | A.S.H. van der Heide, J. Poortmans | ![]() |