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Title:
 
Vertical Junction Under Constant Multispectral Light: Determination of Recombination Parameters
 
Author(s):
 
M.M. Dione, S. Mbodji, M.L. Samb, M. Dieng, M. Thiame, S. Ndoye, F.I. Barro, G. Sissoko
 
Keywords:
 
Diffusion Length, Recombination Velocity, Vertical Junction
 
Topic:
 
Advanced Photovoltaics
Subtopic: Fundamental Studies
Event: 24th European Photovoltaic Solar Energy Conference, 21-25 September 2009, Hamburg, Germany
Session: 1CV.4.14
 
Pages:
 
465 - 468
ISBN: 3-936338-25-6
Paper DOI: 10.4229/24thEUPVSEC2009-1CV.4.14
 
Price:
 
 
0,00 EUR
 
Document(s): paper
 

Abstract/Summary:


A theoretical study of a vertical parallel junction under constant multispectral light has been made. We use a power of series method to solve the continuity equation, and determine an expression of the excess minority carrier density. The photocurrent density Jph is presented as a calibrated function, diffusion length dependent. It intercepts with the experimental short circuit current density JSC, at the minority carriers diffusion length L value. The photovoltage as a calibrated function of surface recombination velocity intercept the experimental open circuit voltage at the junction intrinsic recombination velocity.