Title:	X-Ray Tomosynthesis for Defect Recognition in Cystalline Silicon Solar Cells with Layer Resolution
Author(s):	U. Hoyer, V. Voland, M. Salamon, N. Uhlmann, R. Auer, C.J. Brabec
Topic:	COMPONENTS FOR PV SYSTEMS
Subtopic:	PV Modules
Event:	28th European Photovoltaic Solar Energy Conference and Exhibition
Session:	4CO.10.4
Pages:	2858 - 2860
ISBN:	3-936338-33-7
Paper DOI:	10.4229/28thEUPVSEC2013-4CO.10.4
Price:	0,00 EUR
Document(s):	paper

Abstract/Summary:

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The investigation of layers in solar module which are concealed under other layers is often very difficult and can be done in many cases only by destroying the module. Here X-ray techniques are helpful due to their non-destructive nature. In contrast to the ordinary X-ray radioscopic method the tomosynthesis technique exhibits additional depth information of the solar cells and modules. In this article several applications of tomosynthesis for the investigation of solar cells and modules are studied. It will be shown which potential the application of X-ray and especially tomosynthesis has as quality control tool for photovoltaics.