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Title:
 
Irradiance and Temperature Test Method for Light and Elevated Temperature Induced Degradation and Regeneration on Commercial PERC Modules
 
Author(s):
 
E. Garcia Goma, M. Passaro, S. Roest, C. Chan, A. Ciesla
 
Topic:
 
Photovoltaic Modules and BoS Components
Subtopic: PV Module Design, Manufacture, Performance and Reliability
Event: 35th European Photovoltaic Solar Energy Conference and Exhibition
Session: 5DO.9.4
ISBN: 3-936338-50-7
 
Price:
 
 
0,00 EUR
 
Document(s): presentation
 

Abstract/Summary:


As an indirect result of COP21, attractiveness of PV and LCOE of PV being lower than coal; fast growing installation regions have shifted from temperate zones (Europe, North America) to more hot and/or humid areas. The higher irradiances in these regions (South East Asia, Africa, Latin America & Middle East)have an accelerated effect on degradation effects, such as LID. Both mono and poly PERC (more so) cell technologies suffer to a greater degree from LID than traditional Back Surface Field (BSF) cells as according to Fraunhofer CSP and UNSW [1][2]. LID in PERC typically forms due to one of the four contaminants (dangling bonds, Fe, Cu, B) forming complexes which in turn cause trap states [1]. Additionally, UNSW argues that there be a yet to be documented type 2 defect in poly PERC which is only activated when dark annealed or present over a longer duration of time as secondary LID defect.