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Title:
 
Single Diode Model Applied to PV Module Aging
 
Author(s):
 
N. Hrelja, M. Van Iseghem, E. Lajoie-Mazenc, E. Moulines, E. Vernet
 
Keywords:
 
Degradation, Parameter Estimation, Single Diode Model, CMA-ES
 
Topic:
 
Photovoltaic Modules and BoS Components
Subtopic: PV Module Design, Manufacture, Performance and Reliability
Event: 35th European Photovoltaic Solar Energy Conference and Exhibition
Session: 5CV.3.16
 
Pages:
 
1290 - 1293
ISBN: 3-936338-50-7
Paper DOI: 10.4229/35thEUPVSEC20182018-5CV.3.16
 
Price:
 
 
0,00 EUR
 
Document(s): paper
 

Abstract/Summary:


The outdoor exposure of PV modules to different climatic variables and physical stresses reduces the power delivery capacity of a PV module over time. The degradation of the PV performance over lifetime is usually determined within the variation of Power at maximum power point (PMPP) and Fill Factor (FF) where the same magnitude of losses of the PMPP can have different causes with different evolution over time. The physic based understanding and modeling of the performance, using the IV curve measurements, can be used to estimate important device parameters and evaluate the health state of the system. In this context the physical model of PV could provide more granulated information about degradation and underlying mechanisms to make better predictions about service life. Single diode model parameter evolution was estimated from 8 years of outdoor IV curve measurements under a range of operating conditions without translating to STC. The results show that the main ageing factors are closely related to the decrease in short-circuit current due to the optical degradation and increase in series resistance regardless of outdoor operating conditions.