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Comparison of Accelerated Ageing and Metastabilities between CIGS Based Solar Cells and Thin-Film Modules
R. Vidal Lorbada, T. Lavrenko, D. Mücke, T. Walter
Reliability, Module, Cu (InGa) Se2
Perovskites, other Non-Silicon-Based Photovoltaics and Multi-Junction Devices
Subtopic: CI(G)S, CdTe and Related Thin Film Solar Cells
Event: 36th European Photovoltaic Solar Energy Conference and Exhibition
Session: 3BV.1.3
645 - 648
ISBN: 3-936338-60-4
Paper DOI: 10.4229/EUPVSEC20192019-3BV.1.3
0,00 EUR
Document(s): paper


The reliability of different CIGS devices (lab scale cells and mini-modules with P1/P2/P3 interconnects) has been investigated after accelerated aging treatments. These treatments consisted in maintaining the sample devices inside a climate chamber at high temperatures and in some cases applying on them a voltage bias reverse or forward. The degradation of the performance was studied with optical and electrical characterization techniques (I-V, C-V and Photoluminescence imaging), and the characteristics of both types of devices were compared before and after the accelerated ageing treatment was applied. Our findings suggest that the degradation of both device types is similar. In both cases the open circuit voltage, the fill factor and the efficiency were reduced, the only exception being the devices that were treated with a forward bias (both mini-modules and lab scale cells), in which these parameters were found to be stable during the treatment. Additionally, one difference was found during the treatment under a reverse voltage bias, namely that the saturation current was reduced in the case of mini-modules but not in the case of lab scale cells.