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Spectral Influences on Measurement Uncertainty of a-Si/μc-Si Multi-Junction Solar Devices
H. Seifert, J. Hohl-Ebinger, W. Warta
Calibration, Multijunction Solar Cell, Uncertainty, a-Si/µ-Si
Thin Film Solar Cells
Subtopic: Amorphous and Microcrystalline Silicon Solar Cells
Event: 26th European Photovoltaic Solar Energy Conference and Exhibition
Session: 3AV.2.46
2714 - 2717
ISBN: 3-936338-27-2
Paper DOI: 10.4229/26thEUPVSEC2011-3AV.2.46
0,00 EUR
Document(s): paper


If multi-junction solar devices are measured at artificial sunlight, the results are strongly affected by the spectral irradiance of the sun simulator. Therefore a spectral adjustment of a multi-source solar simulator is crucial to ensure standard test conditions (STC). The calculation of the settings, in terms of spectral correction, is done with respect to the spectral response (SR) of the reference cell and all sub cells of the test device, as well as the spectral distributions of each source of the solar simulator. In this study we examine the measurement uncertainties of the SR of both sub cells of an a-Si/μc-Si tandem solar cell. The relative input data of the spectral correction procedure are varied with random walks within their uncertainty.