Title:	Comparison of Laser Textured Silicon Surfaces Prepared by Different Laser Sources
Author(s):	Z. Tóth, A. Gárdián, M. Füle, J. Csontos, F. Korsós, P. Basa
Keywords:	Laser Processing, Silicon (Si), Texturisation, Texturization
Topic:	MATERIAL STUDIES, NEW CONCEPTS, ULTRA-HIGH EFFICIENCY AND SPACE TECHNOLOGY
Subtopic:	New Materials and Concepts for Cells
Event:	28th European Photovoltaic Solar Energy Conference and Exhibition
Session:	1AV.3.37
Pages:	441 - 444
ISBN:	3-936338-33-7
Paper DOI:	10.4229/28thEUPVSEC2013-1AV.3.37
Price:	0,00 EUR
Document(s):	paper, poster

Abstract/Summary:

---

Four different lasers with various wavelengths, pulse lengths and intensities were applied for laser ablation resulting laser textured, “black” silicon surfaces. The aim was to compare the optical properties of samples structured by the different lasers, and so to find the optimal configuration and to investigate its viability for photovoltaic applications. At this first stage, the evolution of the significantly different surface morphologies was studied by scanning electron microscopy and characterization of the resulted surface reflectance. The structural changes of the surface were investigated by Raman spectroscopy. Laser ablation processes are discussed explaining the shape of the resulted structures. Based on the trend of the morphology and reflectance changes, the obtained laser induced textures and their antireflective properties are compared. Around 2% total reflectance was achieved in the visible and near infrared spectral ranges texturing by some tenth of pulses from the femtosecond excimer laser.