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Title:
 
Sweep Time, Spectral Mismatch and Light Soaking in Thin Film Module Measurements
 
Author(s):
 
J. Kuurne, A. Tolvanen, J. Hyv√§rinen
 
Keywords:
 
Performance, Thin Film Paste, MotherPV Method
 
Topic:
 
Components for PV Systems
Subtopic: PV Modules
Event: 23rd European Photovoltaic Solar Energy Conference and Exhibition, 1-5 September 2008, Valencia, Spain
Session: 4AV.3.27
 
Pages:
 
2855 - 2857
ISBN: 3-936338-24-8
Paper DOI: 10.4229/23rdEUPVSEC2008-4AV.3.27
 
Price:
 
 
0,00 EUR
 
Document(s): paper
 

Abstract/Summary:


Measurements of thin film modules with a single flash inline simulator were compared to outdoor measurements with 6 different modules (2 a-Si, 2 CdTe and 2 CIGS). Outdoor measurements were done with voltage sweep times ranging from 0.5 to 25 ms. The performance of CdTe modules was measured before and after light soaking. Sweep time was not observed to have an effect on the measured performance with sweeps over 1 ms. Sweeps shorter than 1 ms can reduce the measured power particularly with a-Si modules. The differences with outdoor and indoor measurements were small implying the measurement is not sensitive to the used spectrum. The largest difference between indoor and outdoor performance was observed for triple junction a-Si.