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Title:
 
Low-Cost Amorphous Silicon Module Design for Long-Term Reliability
 
Author(s):
 
K.W. Jansen, A. Varvar, E. Twesme, T. Berens, N.G. Dhere
 
Keywords:
 
a-Si, Performance, Reliability
 
Topic:
 
Components for PV Systems
Subtopic: PV Modules
Event: 23rd European Photovoltaic Solar Energy Conference and Exhibition, 1-5 September 2008, Valencia, Spain
Session: 4AV.3.37
 
Pages:
 
2885 - 2888
ISBN: 3-936338-24-8
Paper DOI: 10.4229/23rdEUPVSEC2008-4AV.3.37
 
Price:
 
 
0,00 EUR
 
Document(s): paper
 

Abstract/Summary:


Low-cost amorphous silicon modules have the ability to generate significant economic value, provided that they can operate reliably throughout their intended service life. EPV Solar has developed their low-cost module design using an approach of 1) identifying failure modes found in outdoor testing, 2) developing tests to simulate these failures, and 3) using these tests to optimize the module design to improve long term reliability. As part of this process, EPV Solar has identified four key loss mechanisms that must be considered in a robust a-Si module design, including light-induced degradation, moisture ingress and corrosion, TCO delamination, and glass breakage. Approaches to mitigate these factors are discussed and accelerated tests are described to facilitate the module design process. Outdoor test results at the Florida Solar Energy Center have demonstrated that modules using the low-cost EPV Solar design are capable of an energy yield of over 1260 kWh/kWp/yr.