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Uncertainties in the Calibration of Thin Film Based Silicon Based Multi-Junction Devices Using Single Source Solar Simulators
Y. Qiu, T.R. Betts, R. Gottschalg, W. Herrmann
Calibration, Silicon (Si), Thin Film Paste, Uncertainty, Multijunction
Components for PV Systems
Subtopic: PV Modules
Event: 23rd European Photovoltaic Solar Energy Conference and Exhibition, 1-5 September 2008, Valencia, Spain
Session: 4AV.3.39
2893 - 2898
ISBN: 3-936338-24-8
Paper DOI: 10.4229/23rdEUPVSEC2008-4AV.3.39
0,00 EUR
Document(s): paper


This paper presents a detailed analysis of the uncertainties for the spectral mismatch of micro-morph thin film solar cell. The uncertainty analysis involves Monte Carlo simulation of wavelength-dependent random errors and addition of systematic (bias) errors with different error distributions, respectively, for different types of solar simulators. The mechanism of spectral mismatch of micro-morph double junction solar cell is analyzed followed by the error sensitivity study of wavelength integration limits to the uncertainty of spectral mismatch and the quantification of final uncertainty which combines the random error and the bias error for different solar simulators. It demonstrated that depending on the error distribution and the magnitude the uncertainty for the spectral mismatch factor varies between 1.0% to 10%, depending on the solar simulators used. The uncertainty of spectral mismatch error can be up to 200% for a specific wavelength integration range.