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Title:
 
Influence of Grain Size and Grain Boundary Recombination Velocity on the Series and Shunt Resistances of a Polycrystalline Silicon Solar Cell
 
Author(s):
 
I. Barro, S. Gaye, M. Deme, H.L. Ly Diallo, M.L. Samb, A.M. Samoura, S. Mbodji, G. Sissoko
 
Keywords:
 
Polycrystalline, Series Resistance, Shunt Resistance
 
Topic:
 
Advanced Photovoltaics
Subtopic: Fundamental Studies
Event: 23rd European Photovoltaic Solar Energy Conference and Exhibition, 1-5 September 2008, Valencia, Spain
Session: 1CV.2.65
 
Pages:
 
612 - 615
ISBN: 3-936338-24-8
Paper DOI: 10.4229/23rdEUPVSEC2008-1CV.2.65
 
Price:
 
 
0,00 EUR
 
Document(s): paper
 

Abstract/Summary:


A three-dimensional study is made to improve the theoretical approach of the series and shunt resistances of a polycrystalline silicon solar cell. The series and shunt resistances are calculated in the base region of the cell and the influence of grain size and grain boundary recombination velocity on these resistances are shown.