Search documents

Browse topics

Document details

Measurement of Subcell Capacitance in Triple Junction Solar Cells with Pulsed Illumination
M. Rutzinger, M. Salzberger, H. Nesswetter, A. Gerhard, P. Lugli, C.G. Zimmermann
Capacitance, Degradation, Multijunction Solar Cell, Characterisation, Characterization, III-V Semiconductors
Concentrator and Space Photovoltaics
Subtopic: III-V-Based Devices for Terrestrial and Space Applications
Event: 33rd European Photovoltaic Solar Energy Conference and Exhibition
Session: 4DO.4.4
1232 - 1235
ISBN: 3-936338-47-7
Paper DOI: 10.4229/EUPVSEC20172017-4DO.4.4
0,00 EUR
Document(s): paper


The evolution of the subcell capacitance of triple junction solar cells upon 3 MeV electron irradiation is studied. Photocurrent is induced subcell specific using a sequence of spatially homogeneous, monochromatic light pulses. The used method is based on the externally measured transient voltage, which allows to calculate the depletion layer capacitance. Capacitance-voltage curves for each subcell are obtained. From these curves, the base layer effective doping density and thus the carrier removal rate are extracted for the top and middle subcell. Additionally, the built-in voltage and its degradation is measured.